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Τι (ποιος) είναι scanning$72405$ - ορισμός

BRANCH OF MICROSCOPY
Probe microscopy; Microscopy, scanning probe; Scanning probe microscope; Scanning force microscope; Scanning probe technique

Scanning (journal)         
SCIENTIFIC JOURNAL
Scanning the journal of scanning microscopies; Scanning: J Scanning Microsc; Scanning: J. Scanning Microsc.; Scanning (Hindawi journal); Scanning: The Journal of Scanning Microscopies
SCANNING: The Journal of Scanning Microscopies is a peer-reviewed scientific journal covering all aspects of scanning microscopy, including scanning electron, scanning probe and scanning optical microscopies. Since 1 January 2017, Scanning become fully open access.
Scanning tunneling microscope         
  • A large STM setup at the [[London Centre for Nanotechnology]]
  • Scanning tunneling microscope operating principle
  • Schematic view of an STM
  • A 1986 STM from the collection of [[Musée d'histoire des sciences de la Ville de Genève]]
  • The real and imaginary parts of the wave function in a rectangular potential barrier model of the scanning tunneling microscope
  • Tip, barrier and sample wave functions in a model of the scanning tunneling microscope. Barrier width is ''w''. Tip bias is ''V''. Surface work functions are ''ϕ''.
  • Negative sample bias ''V'' raises its electronic levels by ''e⋅V''. Only electrons that populate states between the Fermi levels of the sample and the tip are allowed to tunnel.
A MICROSCOPE USED FOR LOOKING AT ATOMS.
Electron tunnel microscopy; Scanning tunneling; Scanning Tunneling Microscope; Scanning tunneling microscopy; Scanning tunnelling microscope; Scanning tunnelling microscopy; Microscopy, scanning tunneling; Scanning-tunneling microscope; Scanning Tunneling Microscopy; STM microscope; Josephson tunneling microscope
A scanning tunneling microscope (STM) is a type of microscope used for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer, then at IBM Zürich, the Nobel Prize in Physics in 1986.
Near-field scanning optical microscope         
  •  bibcode = 2015NatCo...6.7993B }}</ref>
  • Apertured modes of operation: a) illumination, b) collection, c) illumination collection, d) reflection and e) reflection collection.<ref name="NSOM Intro"/>
  • Apertureless modes of operation: a) photon tunneling (PSTM) by a sharp transparent tip, b) PSTM by sharp opaque tip on smooth surface, and c) scanning interferometric apertureless microscopy with double modulation.<ref name="Kaupp06"/>
  • Block diagram of an apertureless reflection-back-to-the-fiber NSOM setup with shear-force distance control and cross-polarization; 1: [[beam splitter]] and crossed polarizers; 2: shear-force arrangement; 3: sample mount on a piezo stage.<ref name="NSOM Intro">[http://www.physics.ncsu.edu/optics/nsom/NSOMintro.html ''Introduction to NSOM.'' The Optics Laboratory, North Carolina State University. 12 October 2007]</ref>
  • Sketch of a) typical metal-coated tip, and b) sharp uncoated tip.<ref name="Kaupp06"/>
NSOM; Scanning near-field optical microscope; NSOM microscopy; Near field scanning optical microscopy; Near-field scanning optical microscopy; Near field scanning optical microscope; SNOM; Scanning Near-Field Optical Microscopy; Scanning near-field optical microscopy; Near-field scanning; Scattering-type scanning near-field optical microscopy
Near-field scanning optical microscopy (NSOM) or scanning near-field optical microscopy (SNOM) is a microscopy technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. In SNOM, the excitation laser light is focused through an aperture with a diameter smaller than the excitation wavelength, resulting in an evanescent field (or near-field) on the far side of the aperture.

Βικιπαίδεια

Scanning probe microscopy

Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level. The first successful scanning tunneling microscope experiment was done by Gerd Binnig and Heinrich Rohrer. The key to their success was using a feedback loop to regulate gap distance between the sample and the probe.

Many scanning probe microscopes can image several interactions simultaneously. The manner of using these interactions to obtain an image is generally called a mode.

The resolution varies somewhat from technique to technique, but some probe techniques reach a rather impressive atomic resolution. This is due largely because piezoelectric actuators can execute motions with a precision and accuracy at the atomic level or better on electronic command. This family of techniques can be called "piezoelectric techniques". The other common denominator is that the data are typically obtained as a two-dimensional grid of data points, visualized in false color as a computer image.